Comparison of electronic transport characterization methods for alkanethiol self-assembled monolayers

被引:120
作者
Lee, T
Wang, WY
Klemic, JF
Zhang, JJ
Su, J
Reed, MA
机构
[1] Yale Univ, Dept Elect Engn, New Haven, CT 06520 USA
[2] Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA
[3] Yale Univ, Dept Phys, New Haven, CT 06520 USA
关键词
D O I
10.1021/jp049541r
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Room-temperature charge transport is investigated for various-length alkanethiol self-assembled monolayers using three different characterization methods, in which lateral areas span from the nanometer to the micrometer scale. In each method, the measured current-voltage characteristics are analyzed with metal-insulator-metal tunneling models. Transport parameters are determined where possible and compared across methods, as well as to previously reported values. Advantages and limitations of each method for characterizing molecular junctions are highlighted.
引用
收藏
页码:8742 / 8750
页数:9
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