Analysis of matrix characterization by X-ray diffraction and synchrotron radiation

X-ray spectrometry is a non-destructive and multi-elemental technique widely used for elemental analysis. This technique has inherent complexities for quantitative analysis because of matrix effects. Matrix absorption is the most important factor when measurements are carried out using thick samples. Therefore, new methods have to be developed in order to evaluate matrix effects. In this work, the feasibility of using the synchrotron X-ray diffraction for matrix characterization has been investigated. All measurements were performed at the Laboratorio Nacional de Luz Sincrotron (LNLS), in Campinas, Brazil. The diffraction patterns of boric acid and cellulose matrix with different oxides were carried out. The preliminary results encourage us to examine further the application of X-ray diffraction analysis combined with energy-dispersive X-ray fluorescence technique for the characterization of thick samples. (C) 2002 Elsevier Science Ltd. All rights reserved.