Low-temperature evolution of local polarization properties of PbZr0.65Ti0.35O3 thin films probed by piezoresponse force microscopy

被引:9
作者
Andreeva, N. V. [1 ]
Tyunina, M. [2 ]
Filimonov, A. V. [1 ]
Rudskoy, A. I. [1 ]
Pertsev, N. A. [1 ,3 ]
Vakhrushev, S. B. [1 ,3 ]
机构
[1] St Petersburg State Polytech Univ, St Petersburg, Russia
[2] Univ Oulu, Microelect & Mat Phys Labs, FI-90014 Oulu, Finland
[3] Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
基金
芬兰科学院;
关键词
DOMAIN-WALL;
D O I
10.1063/1.4869147
中图分类号
O59 [应用物理学];
学科分类号
070305 [高分子化学与物理];
摘要
The temperature evolution of local polarization properties in epitaxial PbZr0.65Ti0.35O3 films is studied by the low-temperature piezoresponse force microscopy (PFM). Pronounced changes in the film polarization state, including apparent polarization rotations and possible transitions between single-domain and polydomain states of individual ferroelectric nanocolumns, are revealed on cooling from the room temperature to 8 K using PFM imaging. More than two-fold increase in the coercive voltage extracted from the piezoresponse hysteresis loops is found on cooling from 240 to 8 K. The results are explained by the thermodynamic theory of strained epitaxial perovskite ferroelectric films. (C) 2014 AIP Publishing LLC.
引用
收藏
页数:5
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