Direct thermal conductance measurements on suspended monocrystalline nanostructures

被引:141
作者
Tighe, TS [1 ]
Worlock, JM [1 ]
Roukes, ML [1 ]
机构
[1] UNIV UTAH,DEPT PHYS,SALT LAKE CITY,UT 84112
关键词
D O I
10.1063/1.118994
中图分类号
O59 [应用物理学];
学科分类号
摘要
We describe and demonstrate a new class of devices that enable direct thermal conductance measurements on monocrystalline nanostructures. These are possible through our newly developed techniques for three-dimensional, successive surface nanomachining of GaAs-based heterostructures. Our methods allow the patterning of complex devices comprising electrically insulating, mesoscopic thermal conductors with separate, thermal transducers in situ. Intimate thermal contact between these elements is provided by their epitaxial registry. Low-temperature thermal conductance measurements indicate that phonon boundary scattering in these initial nanometer is scale structures is partially specular. These devices offer promise for ultrasensitive bolometry and calorimetry. (C) 1997 American Institute of Physics.
引用
收藏
页码:2687 / 2689
页数:3
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