Accurate measurement and characterization up to 50 GHz of CPW-based integrated passives in microwave MCM-D

被引:13
作者
Carchon, G [1 ]
Brebels, S [1 ]
De Raedt, W [1 ]
Nauwelaers, B [1 ]
机构
[1] Katholieke Univ Leuven, Div Esat Telemic, B-3001 Heverlee, Belgium
来源
50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS | 2000年
关键词
D O I
10.1109/ECTC.2000.853196
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multi-layer CPW-based models are not readily available in commercial simulators. Accurate scaleable models have therefore been implemented and incorporated in a design library offering automated layout. In this way, first-time-right design becomes feasible. A scaleable table-based transmission line model has been implemented. The characteristic impedance and effective dielectric constant of the line are generated by a quasi-TEM program. The linelosses for an arbitrary line-geometry are predicted based on a set of measurements of lines with a fixed ground-to-ground distance. Good agreement between measured and simulated performance has been found. The TaN thin-film resistors are modeled using an RLCG transmission line model. It is shown that R (series resistance per unit length) can be considered constant and is directly determined by the sheetresistance and resistor-width. L and C (series inductance and shunt capacitance-to-ground per unit length) are derived from the Z(c) and epsilon(eff) of an equivalent transmission line in which the resistor-layer is replaced by metal. Excellent agreement between measured and simulated results has been found up to 50 GHz. Scaleable models have also been implemented for square Ta2O5-capacitors in series and shunt-to-ground configuration.
引用
收藏
页码:459 / 464
页数:4
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