Polymer thickness effects on Bosch etch profiles

被引:44
作者
Craigie, CJD [1 ]
Sheehan, T [1 ]
Johnson, VN [1 ]
Burkett, SL [1 ]
Moll, AJ [1 ]
Knowlton, WB [1 ]
机构
[1] Boise State Univ, Coll Engn, Boise, ID 83725 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2002年 / 20卷 / 06期
关键词
D O I
10.1116/1.1515910
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Time-multiplexed etching, the Bosch process, is a technique consisting of alternating etch and deposition cycles to produce high aspect-ratio etched features. The Bosch process uses SF6 and C4F8 as etch and polymer deposition gases, respectively. In these experiments, polymer thickness is controlled by both C4F8 gas flow rates and by deposition cycle time. The authors show that polymer thickness can be used to control wall angle and curvature at the base of feature walls. Wall angle is found to be independent of trench width under thin-polymer deposition conditions. Experimental results are compared to results obtained by other researchers using the more conventional simultaneous etch/deposition technique. (C) 2002 American Vacuum Society.
引用
收藏
页码:2229 / 2232
页数:4
相关论文
共 7 条
[1]   PLASMA-ETCHING - DISCUSSION OF MECHANISMS [J].
COBURN, JW ;
WINTERS, HF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :391-403
[2]   FORMATION OF DEEP HOLES IN SILICON BY REACTIVE ION ETCHING [J].
HIROBE, K ;
KAWAMURA, K ;
NOJIRI, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (02) :594-600
[3]  
Laermer F., 1996, Patent, Patent No. [5,501,893, 5501893]
[4]  
Laermer F., 1992, Patent No. 4241045
[5]   LOW-TEMPERATURE REACTIVE ION ETCHING AND MICROWAVE PLASMA-ETCHING OF SILICON [J].
TACHI, S ;
TSUJIMOTO, K ;
OKUDAIRA, S .
APPLIED PHYSICS LETTERS, 1988, 52 (08) :616-618
[6]   Comparison of Bosch and cryogenic processes for patterning high aspect ratio features in silicon [J].
Walker, MJ .
MEMS DESIGN, FABRICATION, CHARACTERIZATION, AND PACKAGING, 2001, 4407 :89-99
[7]   Deep-submicron trench profile control using a magnetron enhanced reactive ion etching system for shallow trench isolation [J].
Yeon, CK ;
You, HJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (03) :1502-1508