共 9 条
- [2] Hidaka T, 1996, APPL PHYS LETT, V68, P2358, DOI 10.1063/1.115857
- [3] Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (01): : 457 - 462
- [6] Sarid D., 1994, SCANNING FORCE MICRO
- [8] CONTACT ELECTRIFICATION USING FORCE MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1989, 63 (24) : 2669 - 2672