Electrostatic force microscopy of silver nanocrystals with nanometer-scale resolution

被引:41
作者
Nyffenegger, RM [1 ]
Penner, RM [1 ]
Schierle, R [1 ]
机构
[1] PK SCI INSTRUMENTS,SUNNYVALE,CA 94089
关键词
D O I
10.1063/1.119425
中图分类号
O59 [应用物理学];
学科分类号
摘要
Silver nanoparticles on graphite basal plane surfaces were concurrently imaged using electrostatic force microscopy (EFM) and noncontact atomic force microscopy. EFM images were obtained having a lateral resolution of 4-5 nm, and a resolution perpendicular to the surface of approximate to 1 nm. The dependence of the contrast in the EFM data for the silver nanoparticles as a function of the applied tip bias was consistent with a positive charge for the silver nanocrystals on the graphite surface, qualitatively as expected by theory. (C) 1997 American Institute of Physics.
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页码:1878 / 1880
页数:3
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