Some practical considerations in fringe projection profilometry

被引:173
作者
Wang, Zhaoyang [1 ]
Nguyen, Dung A. [1 ]
Barnes, John C. [1 ]
机构
[1] Catholic Univ Amer, Dept Mech Engn, Washington, DC 20064 USA
基金
美国国家科学基金会;
关键词
Fringe projection; 3D shape measurement; 3D imaging; High accuracy; Fast speed; 3-DIMENSIONAL SHAPE MEASUREMENT; LEAST-SQUARES APPROACH; PHASE-SHIFTED INTERFEROGRAMS; ADVANCED ITERATIVE ALGORITHM; NONPARALLEL ILLUMINATION; CALIBRATION; SYSTEM;
D O I
10.1016/j.optlaseng.2009.06.005
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
As technologies evolve, there have been high demands for the three-dimensional (3D) shape measurement techniques to posses the following combined technical features: high accuracy, fast speed, easy implementation, capability of measuring multiple objects as well as measuring complex shapes. Generally, the existing techniques can satisfy some of the requirements, but not all of them. This paper presents four practical considerations in fringe projection profilometry (FPP) based 3D shape measurements, along with simple but robust solutions, including gamma correction of digital projection, arbitrary setup of system components, phase unwrapping with multi-frequency fringes, and system calibration with a least-squares inverse approach. The validity and practicability of the FPP-based 3D shape measurement technique using the four corresponding technical approaches have been verified by experiments. The presented technique is capable of satisfying the various critical demands in enormous scientific and engineering applications. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:218 / 225
页数:8
相关论文
共 32 条
[1]   Reverse engineering by fringe projection [J].
Burke, J ;
Bothe, T ;
Osten, W ;
Hess, C .
INTERFEROMETRY XI: APPLICATIONS, 2002, 4778 :312-324
[2]   Overview of three-dimensional shape measurement using optical methods [J].
Chen, F ;
Brown, GM ;
Song, MM .
OPTICAL ENGINEERING, 2000, 39 (01) :10-22
[3]   Fringe projection profilometry with nonparallel illumination: a least-squares approach [J].
Chen, LJ ;
Quan, CG .
OPTICS LETTERS, 2005, 30 (16) :2101-2103
[4]   Reply to Comment on "Fringe projection profilometry with nonparallel illumination: a least-squares approach" [J].
Chen, Lujie ;
Quan, Chenggen .
OPTICS LETTERS, 2006, 31 (13) :1974-1975
[5]   High-speed surface profilometer based on a spatial light modulator and pipeline image processor [J].
Coggrave, CR ;
Huntley, JM .
OPTICAL ENGINEERING, 1999, 38 (09) :1573-1581
[6]   Three-dimensional shape measurement with an arbitrarily arranged fringe projection profilometry system [J].
Du, Hua ;
Wang, Zhaoyang .
OPTICS LETTERS, 2007, 32 (16) :2438-2440
[7]  
Ferraro P., 2006, OPTICAL INSPECTION M, V109, P351, DOI DOI 10.1201/9781420019162.ch12
[8]   Least-squares fitting of carrier phase distribution by using a rational function in profilometry fringe projection [J].
Guo, Hongwei ;
Chen, Mingyi ;
Zheng, Peng .
OPTICS LETTERS, 2006, 31 (24) :3588-3590
[9]   Least-squares calibration method for fringe projection profilometry [J].
Guo, HW ;
He, HT ;
Yu, YJ ;
Chen, MY .
OPTICAL ENGINEERING, 2005, 44 (03) :1-9
[10]   Gamma correction for digital fringe projection profilometry [J].
Guo, HW ;
He, HT ;
Chen, M .
APPLIED OPTICS, 2004, 43 (14) :2906-2914