Least-squares fitting of carrier phase distribution by using a rational function in profilometry fringe projection

被引：46

作者：

Guo, Hongwei ^{[1
]}

Chen, Mingyi ^{[1
]}

Zheng, Peng ^{[1
]}

机构：

[1] Shanghai Univ, Dept Precis Mech Engn, Lab Appl Opt & Metrol, Shanghai 200072, Peoples R China

来源：

OPTICS LETTERS | 2006年 / 31卷 / 24期

关键词：

D O I：

10.1364/OL.31.003588

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A least-squares fitting technique for the carrier phase component in fringe projection profilometry is presented. The carrier phase distribution for an arbitrary measurement system can be perfectly described with a rational function, whose coefficients can be estimated by least-squares fitting to the measured reference phases, so that the restrictions and limitations in the existing techniques are eliminated. (c) 2006 Optical Society of America.

引用

页码：3588 / 3590

页数：3

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