Rietveld analysis of electron powder diffraction data from nanocrystalline anatase, TiO2

被引：104

作者：

Weirich, TE ^{[1
]}

Winterer, M ^{[1
]}

Seifried, S ^{[1
]}

Hahn, H ^{[1
]}

Fuess, H ^{[1
]}

机构：

[1] Tech Univ Darmstadt, Fachbereich Mat Wissensch, Fachgebiet Strukturforsch, D-64287 Darmstadt, Germany

来源：

ULTRAMICROSCOPY | 2000年 / 81卷 / 3-4期

关键词：

nanocrystalline anatase; rietveld refinement; electron powder diffraction;

D O I：

10.1016/S0304-3991(99)00189-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The structure of nanocrystalline anatase (TiO2) was successfully refined from electron powder diffraction data using the Rietveld technique. A polycrystalline sample (average crystal size about 70 Angstrom) was characterised by selected area electron diffraction in a conventional transmission electron microscope operated at 300 kV. Radially integrated intensities were extracted from digitised photographic films and used in the course of structure refinements by a standard program for Rietveld analysis. The structure was refined in space group I4(1)/amd (#141) with lattice parameters a = 3.7710(9) Angstrom and c = 9.430(2) Angstrom. The reliability factors of the refinement are R-wp = 5.2% and R-B = 2.6%. The close agreement of the refined structural parameters with previous results obtained from neutron diffraction on coarse-grained powders proves the applicability of the method for characterising nanocrystalline powders. The present study shows that Rietveld analysis on electron powder data is a good compliment to the existing methods for accurate structural investigations on nanocrystalline materials and thin films. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：263 / 270

页数：8

共 43 条

[21] Atomic Form Factor Determination with Electrons [J].