Physical and electrical characterization of CdS films deposited by vacuum evaporation, solution growth and spray pyrolysis

被引：50

作者：

Chavez, H ^{[1
]}

Jordan, M ^{[1
]}

McClure, JC ^{[1
]}

Lush, G ^{[1
]}

Singh, VP ^{[1
]}

机构：

[1] UNIV TEXAS,DEPT ELECT ENGN,EL PASO,TX 79968

来源：

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 1997年 / 8卷 / 03期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1023/A:1018537928315

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The physical and electrical characteristics of CdS thin films deposited by vacuum evaporation, solution growth and spray pyrolysis were analysed. The effects of the common grain growth promoter CdCl2 and annealing were investigated. Grain size, bulk composition and surface composition were measured by energy-dispersive X-ray fluorescence, Auger spectroscopy and scanning electron microscopy. Schottky diode analysis was performed to study the electrical characteristics of the films, and energy band gap was measured by spectral transmission.

引用

页码：151 / 154

页数：4