An experimental station for advanced research on condensed matter under extreme conditions at the European Synchrotron Radiation Facility-BM29 beamline

被引:179
作者
Filipponi, A [1 ]
Borowski, M
Bowron, DT
Ansell, S
Di Cicco, A
De Panfilis, S
Itiè, JP
机构
[1] Ist Nazl Fis Mat, I-67010 Laquila, Italy
[2] Univ Aquila, Dipartimento Fis, I-67010 Laquila, Italy
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[4] Univ Camerino, Dipartimento Matemat, I-62032 Camerino, Italy
[5] Ist Nazl Fis Mat, I-62032 Camerino, Italy
[6] Univ Paris 06, LPMC, F-75005 Paris, France
关键词
D O I
10.1063/1.1150631
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We describe state-of-the-art experimental techniques using the beamline BM29 of the European Synchrotron Radiation Facility (ESRF). This station exploits the unique characteristics of an ESRF bending magnet source to provide a tunable, collimated, x-ray beam to perform high quality x-ray absorption spectroscopy within the energy range of E = 5-75 keV using Si(111), Si(311), and Si(511) crystal pairs. Energy scans can be performed over this wide energy range with excellent reproducibility, stability and resolution, usually better than Delta E/E similar or equal to 5 x 10(-5). The experimental setup has been exploited to study condensed matter under extreme conditions. We describe here two sample environment devices; the L' Aquila-Camerino oven for high-temperature studies up to 3000 K in high vacuum and the Paris-Edinburgh press suitable for high-pressure high-temperature studies in the range 0.1-7 GPa and temperatures up to 1500 K. These devices can be integrated in an experimental setup which combines various control and detection systems suitable to perform x-ray absorption spectroscopy, x-ray absorption temperature scans, and energy scanning x-ray diffraction (ESXD). The ESXD setup is based on a scintillator detector behind a fixed angle collimator aligned to the sample. The combination of these three measurements, which can be performed in rapid sequence on the sample during the experiment, provides an essential tool for structural investigations and in situ sample characterization. (C) 2000 American Institute of Physics. [S0034-6748(00)03406-7].
引用
收藏
页码:2422 / 2432
页数:11
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