Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

被引:185
作者
Bonnell, D. A. [1 ]
Kalinin, S. V. [2 ]
Kholkin, A. L. [3 ]
Gruverman, A. [4 ]
机构
[1] Univ Penn, Philadelphia, PA 19104 USA
[2] Oak Ridge Natl Lab, Oak Ridge, TN 37922 USA
[3] Univ Aveiro, Aveiro, Portugal
[4] Univ Nebraska, Lincoln, NE 68588 USA
关键词
THIN-FILMS; FERROELECTRIC SURFACES; ULTRAHIGH DENSITY; PROBE MICROSCOPY; LOCAL REACTIVITY; POLARIZATION; NUCLEATION; PIEZOELECTRICITY; HYSTERESIS; ADSORPTION;
D O I
10.1557/mrs2009.176
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.
引用
收藏
页码:648 / 657
页数:10
相关论文
共 85 条
[71]   Polar nanodomains and local ferroelectric phenomena in relaxor lead lanthanum zirconate titanate ceramics [J].
Shvartsman, VV ;
Kholkin, AL ;
Orlova, A ;
Kiselev, D ;
Bogomolov, AA ;
Sternberg, A .
APPLIED PHYSICS LETTERS, 2005, 86 (20) :1-3
[72]   Relaxation of induced polar state in relaxor PbMg1/3Nb2/3O3 thin films studied by piezoresponse force microscopy -: art. no. 222907 [J].
Shvartsman, VV ;
Kholkin, AL ;
Tyunina, M ;
Levoska, J .
APPLIED PHYSICS LETTERS, 2005, 86 (22) :1-3
[73]   Domain structure of 0.8Pb(Mg1/3Nb2/3)O3-0.2PbTiO3 studied by piezoresponse force microscopy -: art. no. 014102 [J].
Shvartsman, VV ;
Kholkin, AL .
PHYSICAL REVIEW B, 2004, 69 (01)
[74]   Local hysteresis and grain size effect in Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films [J].
Shvartsman, VV ;
Emelyanov, AY ;
Kholkin, AL ;
Safari, A .
APPLIED PHYSICS LETTERS, 2002, 81 (01) :117-119
[75]  
Smolenskii GA., 1954, DOKL AKAD NAUK SSSR, V97, P653
[76]   Observation of nanoscale 180° stripe domains in ferroelectric PbTiO3 thin films -: art. no. 067601 [J].
Streiffer, SK ;
Eastman, JA ;
Fong, DD ;
Thompson, C ;
Munkholm, A ;
Murty, MVR ;
Auciello, O ;
Bai, GR ;
Stephenson, GB .
PHYSICAL REVIEW LETTERS, 2002, 89 (06) :1-067601
[77]   Imaging and engineering the nanoscale-domain structure of a Sr0.61Ba0.39Nb2O6 crystal using a scanning force microscope [J].
Terabe, K ;
Takekawa, S ;
Nakamura, M ;
Kitamura, K ;
Higuchi, S ;
Gotoh, Y ;
Gruverman, A .
APPLIED PHYSICS LETTERS, 2002, 81 (11) :2044-2046
[78]   Domain wall creep in epitaxial ferroelectric Pb(Zr0.2Ti0.8)O3 thin films -: art. no. 097601 [J].
Tybell, T ;
Paruch, P ;
Giamarchi, T ;
Triscone, JM .
PHYSICAL REVIEW LETTERS, 2002, 89 (09)
[79]   GLASSY PHENOMENA IN DISORDERED PEROVSKITE-LIKE CRYSTALS [J].
VAKHRUSHEV, SB ;
KVYATKOVSKY, BE ;
NABEREZHNOV, AA ;
OKUNEVA, NM ;
TOPERVERG, BP .
FERROELECTRICS, 1989, 90 :173-176
[80]  
Vakhrushev SB, 2003, AIP CONF PROC, V677, P74, DOI 10.1063/1.1609940