Pitfalls in measuring work function using photoelectron spectroscopy

被引:148
作者
Helander, M. G. [1 ]
Greiner, M. T. [1 ]
Wang, Z. B. [1 ]
Lu, Z. H. [1 ]
机构
[1] Univ Toronto, Dept Mat Sci & Engn, Toronto, ON M5S 3E4, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
Ultraviolet photoelectron spectroscopy; Work function; Secondary electron cut-off; Fermi level; CONTACT POTENTIAL DIFFERENCES; BINDING-ENERGY CALIBRATION; SPECTROMETERS; SURFACES; PHOTOEMISSION; METALS; SILVER; LEVEL; LAMP; XPS;
D O I
10.1016/j.apsusc.2009.11.002
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Accurate measurement of work function is essential in many areas of research and development. Despite the importance of photoelectron spectroscopy as a technique for measuring work function, there has been relatively little discussion in the literature of how to conduct accurate measurements. We review the basic technique of measuring work function using ultraviolet photoelectron spectroscopy and discuss several common sources of error related to the experimental setup. In particular, the sample-detector geometry is found to be a key experimental parameter; accurate results are only obtained when the sample is perpendicular to the electron detector. In addition, we demonstrate that photoelectron work function values correspond to the minimum work function "patch'' on a non-uniform surface, in contrast to the average work function measured by other techniques, such as the Kelvin probe method. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:2602 / 2605
页数:4
相关论文
共 29 条
  • [1] [Anonymous], 2013, Semiconductor Surfaces and Interfaces
  • [2] Ashcroft N., 2011, Solid State Physics
  • [3] Briggs D., 1992, Practical Surface Analysis, V2nd
  • [4] WINDOWLESS PHOTOELECTRON SPECTROMETER FOR HIGH RESOLUTION STUDIES OF SOLIDS AND SURFACES
    CASHION, JK
    MEES, JL
    EASTMAN, DE
    SIMPSON, JA
    KUYATT, CE
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (11) : 1670 - &
  • [5] WORK FUNCTION MEASUREMENTS ON (110), (100) AND (111) SURFACES OF SILVER
    CHELVAYOHAN, M
    MEE, CHB
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1982, 15 (10): : 2305 - 2312
  • [6] WORK FUNCTION MEASUREMENTS ON (100) AND (110) SURFACES OF SILVER
    DWEYDARI, AW
    MEE, CHB
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 27 (01): : 223 - 230
  • [7] Gupta Arjun K, 2004, HDB BETA DISTRIBUTIO
  • [8] DETERMINATION OF ENERGY-LEVEL SHIFTS WHICH ACCOMPANY CHEMISORPTION
    HAGSTRUM, HD
    [J]. SURFACE SCIENCE, 1976, 54 (02) : 197 - 209
  • [9] Angle-dependent ultraviolet photoelectron spectroscopy of sputter cleaned polycrystalline noble metals
    Helander, M. G.
    Greiner, M. T.
    Wang, Z. B.
    Lu, Z. H.
    [J]. APPLIED SURFACE SCIENCE, 2009, 255 (23) : 9553 - 9556
  • [10] THERMIONIC EMISSION
    HERRING, C
    NICHOLS, MH
    [J]. REVIEWS OF MODERN PHYSICS, 1949, 21 (02) : 185 - 270