The S-state model: a work horse for HRTEM

被引:56
作者
Geuens, P [1 ]
Van Dyck, D [1 ]
机构
[1] Univ Antwerp, RUCA, Dept Phys, EMAT, B-2020 Antwerp, Belgium
关键词
high-resolution transmission electron microscopy (HRTEM); electron diffraction and elastic scattering theory; image simulation;
D O I
10.1016/S0304-3991(02)00276-0
中图分类号
TH742 [显微镜];
学科分类号
摘要
The S-state model describes the dynamical scattering of electrons in a specimen foil, consisting of atom columns parallel to the beam direction, such as a crystal or a particular crystal defect. In this model the electrons are considered to be trapped in the electrostatic potential of an atom column, in which it scatters dynamically. This picture allows physical insight, and it explains why a one-to-one correspondence is maintained between the exit wave and the projected structure, even in case of strong dynamical scattering. Furthermore the model can be parameterised in a simple closed analytical form. Apart from the computational advantages, the S-state model proves to be very useful to deduce the projected structure directly from the exit wave. so as to "invert" the dynamical scattering. In this paper the validity of the S-state model, is evaluated in much depth by a proper quantum mechanical treatment, The analytical parameterisation of the IS eigenfunction and eigenenergy is discussed. It is shown that the method, even in case of small tilts, is valid for most thicknesses, currently used in HRTEM studies. Even for closely spaced atom columns, such as the dumbbells in Si [I 10], Sn [I 10] and GaN [I 10], the positions of the atom columns can be deduced with an accuracy of a few pm. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:179 / 198
页数:20
相关论文
共 36 条
[1]   BLOCH WAVES AND THEIR CORRESPONDING ATOMIC AND MOLECULAR-ORBITALS IN HIGH-ENERGY ELECTRON-DIFFRACTION [J].
BUXTON, BF ;
LOVELUCK, JE ;
STEEDS, JW .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1978, 38 (03) :259-278
[2]   PHASE RETRIEVAL THROUGH FOCUS VARIATION FOR ULTRA-RESOLUTION IN FIELD-EMISSION TRANSMISSION ELECTRON-MICROSCOPY [J].
COENE, W ;
JANSSEN, G ;
DEBEECK, MO ;
VANDYCK, D .
PHYSICAL REVIEW LETTERS, 1992, 69 (26) :3743-3746
[3]   Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy [J].
Coene, WMJ ;
Thust, A ;
deBeeck, M ;
VanDyck, D .
ULTRAMICROSCOPY, 1996, 64 (1-4) :109-135
[4]   AN ANALYTICAL APPROACH FOR THE FAST CALCULATION OF DYNAMICAL SCATTERING IN HRTEM [J].
DEBEECK, MO ;
VANDYCK, D .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 150 (02) :587-602
[5]   Direct structure reconstruction in HRTEM [J].
deBeeck, MO ;
VanDyck, D .
ULTRAMICROSCOPY, 1996, 64 (1-4) :153-165
[6]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[7]   PERIODICITY OF CRYSTAL-STRUCTURE IMAGES IN ELECTRON-MICROSCOPY WITH CRYSTAL THICKNESS [J].
FUJIMOTO, F .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 45 (01) :99-106
[8]  
Fujimoto F., 1972, Radiation Effects, V12, P153, DOI 10.1080/00337577208231136
[9]   Reconstruction of the La0.9Sr0.1MnO3-SrTiO3 interface by quantitative high-resolution electron microscopy [J].
Geuens, P ;
Lebedev, OI ;
Van Tendeloo, G .
SOLID STATE COMMUNICATIONS, 2000, 116 (12) :643-648
[10]  
Geuens P., 1999, ACTA CRYSTALLOGR A S, V55