CdS thin-film electrodeposition from a phosphonium ionic liquid

被引：46

作者：

Izgorodin, Alexey ^{[1
]}

Winther-Jensen, Orawan ^{[1
]}

Winther-Jensen, Bjorn ^{[1
]}

MacFarlane, Douglas R. ^{[1
]}

机构：

[1] Monash Univ, Australian Ctr Electromat Sci, Clayton, Vic 3800, Australia

来源：

PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 2009年 / 11卷 / 38期

基金：

澳大利亚研究理事会;

关键词：

OPTICAL CHARACTERIZATION; CADMIUM; AIR; SEMICONDUCTORS; METALS; GROWTH; LAYER; PH;

D O I：

10.1039/b906995j

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Thin, adherent films of CdS were electrodeposited on FTO coated glass by reduction of a thiosulfate precursor in the presence of Cd(II) ions in methyltributylphosphonium (P-1,P-4,P-4,P-4) tosylate ionic liquid at 130-150 degrees C. The structural properties of the deposits have been characterized by profilometry, scanning electron microscopy (SEM) and optical microscopy. Energy dispersive X-ray spectroscopy (EDX) was used to evaluate the chemical composition, which was found to be close to stoichiometric. Semiconductor properties including the band gap and. at band potential were calculated from UV-Vis and impedance spectroscopy measurements. The crystal structure was analyzed by X-ray diffraction (XRD). The data obtained from XRD and band gap measurements suggest the presence of hexagonal CdS crystals. The possible growth mechanism of the films is also addressed.

引用

页码：8532 / 8537

页数：6

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