Maxwell and Sharvin conductance in gold point contacts investigated using TEM-STM

被引：82

作者：

Erts, D ^{[1
]}

Olin, H

Ryen, L

Olsson, E

Thölén, A

机构：

[1] Latvian State Univ, Inst Chem Phys, LV-1586 Riga, Latvia

[2] Chalmers, SE-41296 Gothenburg, Sweden

[3] Uppsala Univ, Angstrom Lab, SE-75121 Uppsala, Sweden

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 19期

关键词：

D O I：

10.1103/PhysRevB.61.12725

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have investigated the conductance of gold point contacts using a scanning tunneling microscope (STM) inside a transmission electron microscope (TEM). Measuring the conductance of these point contacts as a function of radius, we could directly compare it with theories both in the ballistic regime (Sharvin) as well as in the diffusive regime (Maxwell). The width of the contacts were between a single atom and 20 nm. Using an interpolation formula (Wexler) between the two limits, we obtain a mean free path of 4 nm, which is about ten times shorter than the room-temperature bulk value. The low value indicates an enhanced scattering, which is not due to high temperature in the point contact, instead a large number of scattering centers is created during the point contact formation process.

引用

页码：12725 / 12727

页数：3

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