Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides

被引：77

作者：

Catalá-Civera, JM ^{[1
]}

Canós, AJ ^{[1
]}

Peñaranda-Foix, FL ^{[1
]}

Davó, ED ^{[1
]}

机构：

[1] Univ Politecn Valencia, Dept Comunicac, Valencia 46071, Spain

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2003年 / 51卷 / 01期

关键词：

accuracy study; dielectric properties; microwave measurements; rectangular waveguides;

D O I：

10.1109/TMTT.2002.806940

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An enhanced transmission reflection technique for the precise determination of the complex permittivity of dielectric materials partially filling the cross section of a rectangular waveguide is described. Dielectric properties are determined by an iterative procedure from two-port S-parameter measurements and a numerically generated propagation constant obtained from the analysis of a partially filled waveguide. Convergence of the solution is ensured from perturbational approximations. Unlike previous approaches, uncertainty investigation is performed, taking into account all the parameters involved in the dielectric characterization. Permittivity accuracy values are presented and, hence, an optimum measurement setup can be established. Measurements of reference materials have been carried out to validate the method.

引用

页码：16 / 24

页数：9

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