Study by complementary X-ray techniques of in-depth microstructure in Ni-based superalloys after Pt diffusion treatment

被引:13
作者
Benoist, J
Girardeau, T
Goudeau, P
Badawi, KF
Traverse, A
机构
[1] Univ Poitiers, CNRS, UMR 6630, Lab Met Phys, F-86962 Futuroscope, France
[2] Ctr Univ Paris Sud, UMR 130, LURE, F-91898 Orsay, France
关键词
nickel-based superalloy; microstructure; Pt diffusion;
D O I
10.1016/S0257-8972(02)00559-5
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The in-depth microstructure changes in nickel-based superalloy due to prior Pt diffusion treatment have been analyzed using complementary X-ray methods. X-Ray diffraction shows the presence of a three-phase system in the entire treated thickness for thick Pt coatings (10 mum). Surface probing by X-ray absorption spectroscopy reveals the presence of a Pt-based phase at the top surface. For thinner Pt coatings (5 mum), X-ray diffraction and absorption techniques reveal a homogeneous in-depth microstructure associated with the gamma/gamma' Ni-based superalloy phases. Results obtained for these two thickness values are well correlated with in-depth Pt concentration profiles determined by energy-dispersive X-ray analysis (EDX). (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:200 / 209
页数:10
相关论文
共 27 条
[1]   Studies of zirconium alloy oxide layers using synchrotron radiation [J].
Béchade, JL ;
Dralet, R ;
Goudeau, P ;
Yvon, P .
ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2000, 347-3 :471-476
[2]   Profile analysis of thin film X-ray diffraction peaks [J].
Bimbault, L ;
Badawi, KF ;
Goudeau, P ;
Branger, V ;
Durand, N .
THIN SOLID FILMS, 1996, 275 (1-2) :40-43
[3]   EXAFS STUDY OF CHEMICAL SHORT-RANGE ORDER IN AMORPHOUS NIXTI1-X ALLOYS [J].
CHARTIER, P ;
MIMAULT, J ;
GIRARDEAU, T ;
JAOUEN, M ;
TOURILLON, G .
JOURNAL OF ALLOYS AND COMPOUNDS, 1993, 194 (01) :77-85
[4]  
Cleach C, 2000, J PHYS IV, V10, P155, DOI 10.1051/jp4:20001017
[5]  
CLEACH C, 2000, THESIS POITIERS U
[6]  
DAS DK, 1999, METALL T A, V31, P2037
[7]   SAMPLING DEPTH IN CONVERSION-ELECTRON DETECTION USED FOR X-RAY ABSORPTION [J].
GIRARDEAU, T ;
MIMAULT, J ;
JAOUEN, M ;
CHARTIER, P ;
TOURILLON, G .
PHYSICAL REVIEW B, 1992, 46 (11) :7144-7152
[8]   Ion-beam assisted deposition effect on residual stresses in 304L stainless steel films [J].
Goudeau, P ;
Serrari, A ;
Boubeker, B ;
Eymery, JP .
HIGH TEMPERATURE MATERIAL PROCESSES, 1998, 2 (03) :431-442
[9]  
GOWARD GW, 1971, OXID MET, V3
[10]  
Hauk V., 1997, STRUCTURAL RESIDUAL