Ion-cut silicon-on-insulator fabrication with plasma immersion ion implantation

被引:42
作者
Lu, X [1 ]
Iyer, SSK [1 ]
Hu, CM [1 ]
Cheung, NW [1 ]
Min, J [1 ]
Fan, Z [1 ]
Chu, PK [1 ]
机构
[1] CITY UNIV HONG KONG,DEPT PHYS & MAT SCI,KOWLOON,HONG KONG
关键词
D O I
10.1063/1.120127
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the implementation of ion-cut silicon-on-insulator (SOI) wafer fabrication technique with plasma immersion ion implantation (PIII). The hydrogen implantation rate, which is independent of the wafer size, is considerably higher than that of conventional implantation. The simple PIII reactor setup and its compatibility with cluster-tools offer other ion-cut process optimization opportunities. The feasibility of the PIII ion-cut process is demonstrated by successful fabrication of SOI structures. The hydrogen plasma can be optimized so that only one ion species is dominant. The feasibility of performing ion-cut using helium PIII is also demonstrated. (C) 1997 American Institute of Physics. [S0003-6951(97)00245-3].
引用
收藏
页码:2767 / 2769
页数:3
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