Simultaneous soft X-ray transmission and emission microscopy

被引：90

作者：

Gianoncelli, A. ^{[1
]}

Kaulich, B. ^{[1
]}

Alberti, R. ^{[2
,3
]}

Klatka, T. ^{[2
,3
]}

Longoni, A. ^{[2
,3
]}

de Marco, A. ^{[4
]}

Marcello, A. ^{[4
]}

Kiskinova, M. ^{[1
]}

机构：

[1] ELETTRA Sincrotrone Trieste, Xray Microscopy Sect, I-34012 Trieste, Italy

[2] Politecn Milan, Dipartimento Elettron & Informaz, I-23100 Milan, Italy

[3] Ist Nazl Fis Nucl, Sez Milano, I-20133 Milan, Italy

[4] ICGEB, Dept Mol Virol, I-34012 Padriciano, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2009年 / 608卷 / 01期

关键词：

X-ray fluorescence; Soft X-ray microscopy; Carbon edge; SILICON DRIFT DETECTORS; RESOLUTION; SPECTROSCOPY; MICROPROBE; BEAMLINE; OPTICS; CELLS;

D O I：

10.1016/j.nima.2009.06.035

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Novel low-energy X-ray fluorescence (LEXRF) system based on a multiple Si drift detector (SDD) configuration has been developed and implemented in the European TwinMic X-ray microspectroscopy station operating at the Italian synchrotron radiation facility ELETTRA. The setup, hosting up to eight large-area SDDs with specially adapted readout electronics, has demonstrated excellent performance for elemental analysis in the 280-2200eV photon energy range, which covers the K and L edges of light elements, starting from C. The great advantage is the simultaneous acquisition of LEXRF, absorption and phase contrast maps, providing complementary information on elemental composition and morphology of specimen at submicrometer length scales. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：195 / 198

页数：4

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