TEM and X-ray diffraction investigation of the structural characteristics of the microporous oxide film formed on polycrystalline Ti

被引：9

作者：

de Mussy, JPG

Langelaan, G

Decerf, J

Delplancke, JL

机构：

[1] Free Univ Brussels, Dept Mat Sci & Electrochem, B-1050 Brussels, Belgium

[2] Katholieke Univ Leuven, Dept Met & Mat Engn, B-3001 Heverlee, Belgium

来源：

SCRIPTA MATERIALIA | 2003年 / 48卷 / 01期

关键词：

TEM; X-ray diffraction; titanium; TiO2; texture;

D O I：

10.1016/S1359-6462(02)00323-8

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The microporous TiO2 layer in the vicinity of the Ti-TiO2 interface is formed by a great amount of tiny crystallites. Bigger anatase and rutile crystals stand in the outer region of the oxide. The orientation of a proportion of the TiO2 crystals is influenced by the underlying textured Ti substrate. (C) 2003 Published by Elsevier Science Ltd. on behalf of Acta Materialia Inc.

引用

页码：23 / 29

页数：7

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