X-ray absorption and Auger electron spectroscopy studies of the quality of diamond thin films grown by the oxy-acetylene flame method

被引:26
作者
Gutierrez, A
Lopez, MF
Garcia, I
Vazquez, A
机构
[1] Depto. de Corros. y Proteccion, Ctro. Nac. de Invest. Metalurgicas, CSIC, E-28040 Madrid
[2] Departamento de Dirección, CENIM
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1997年 / 15卷 / 02期
关键词
D O I
10.1116/1.580483
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Diamond thin films grown by the oxy-acetylene flame method have been investigated by x-ray absorption and Auger electron spectroscopies. The quality of the films, defined as the ratio of diamond to non-diamond carbon, has been determined by using both techniques, giving values as high as 95% for the sample grown with the highest C2H2/O-2 molar ratio (0.97). Values obtained by Auger electron spectroscopy are slightly lower due to the smaller probe depth of this technique as compared with x-ray absorption spectroscopy (5 Angstrom in the first case against 50 Angstrom in the latter), and to the higher non-diamond carbon content of the surface, as it is expected from the mechanisms of diamond growth by this method. (C) 1997 American Vacuum Society.
引用
收藏
页码:294 / 297
页数:4
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