Effects of Layer Thickness and Annealing of PEDOT:PSS Layers in Organic Photodetectors

被引:251
作者
Friedel, Bettina [1 ]
Keivanidis, Panagiotis E. [1 ]
Brenner, Thomas J. K. [1 ]
Abrusci, Agnese [1 ]
McNeill, Christopher R. [1 ]
Friend, Richard H. [1 ]
Greenham, Neil C. [1 ]
机构
[1] Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England
基金
英国工程与自然科学研究理事会;
关键词
PSS THIN-FILMS; OPEN-CIRCUIT VOLTAGE; POLYMER SOLAR-CELLS; PHOTOELECTRON-SPECTROSCOPY; WORK FUNCTION; CONDUCTIVITY; MORPHOLOGY; POLY(3,4-ETHYLENEDIOXYTHIOPHENE); DEVICES; ACID;
D O I
10.1021/ma901182u
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
We have investigated the effects of thickness variation and thermal treatment of the electrode polymer poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) in photovoltaic and photodetector devices using conjugated polymer blends as the photoactive material, By variation of the PEDOT:PSS layer thickness between 25 and 150 nm, we found optimum device performance, in particular low dark current and high external quantum efficiency (EQE) and open-circuit voltage (V-oc), at around 70 nm. This has been observed for two different active layers. Annealing studies oil the PEDOT:PSS films, with temperatures varied between 120 and 400 degrees C, showed an optimum device performance, in particular EQE and V-oc at 250 degrees C. This optimum performance was found to be associated with loss of water from the PSS shell of the PEDOT:PSS grains. For annealing temperatures above 260 degrees C, device performance was dramatically reduced. This was associated with chemical decomposition leading to loss of sulfonic acid, although this did not significantly affect the in-plane conductivity.
引用
收藏
页码:6741 / 6747
页数:7
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