Synchrotron radiation photoelectron spectroscopy of the O(2s) core level as a tool for monitoring the reducing effects of ion bombardment on SnO2 thin films

被引：14

作者：

DePadova, P

Larciprete, R

Ottaviani, C

Quaresima, C

Perfetti, P

Borsella, E

Astaldi, C

Comicioli, C

Crotti, C

Matteucci, M

Zacchigna, M

Prince, K

机构：

[1] ENEA, DIP INN FIS, I-00044 FRASCATI, RM, ITALY

[2] CNR, ISM, TRIESTE, ITALY

[3] SINCROTRONE TRIESTE, I-34012 TRIESTE, ITALY

来源：

APPLIED SURFACE SCIENCE | 1996年 / 104卷

关键词：

D O I：

10.1016/S0169-4332(96)00169-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Synchrotron radiation ultraviolet photoemission spectroscopy (UPS) of O(2s) core levels, valence band (VB) and Sn(4d) spectroscopy was used to monitor the effect of Ar+ sputtering on SnO2 films. The decrease of the O(2s) peak intensity and the increase of the Sn2+ component in the Sn(4d) peak could be satisfactorily correlated with the enhancement of the band gap feature, occurring at 2.9 eV in the VB spectrum,never been due to the formation of Sn(5s-5p) states.

引用

页码：349 / 353

页数：5

共 12 条

[1]

COX DF, 1989, SURF SCI, V224, P221

[2] A SYNCHROTRON-RADIATION PHOTOEMISSION-STUDY OF THE OXIDATION OF TIN [J].