Imaging of fullerene molecules on Si(111)-7 X 7 surface with NC-AFM

被引：30

作者：

Kobayashi, K ^{[1
]}

Yamada, H ^{[1
]}

Horiuchi, T ^{[1
]}

Matsushige, K ^{[1
]}

机构：

[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan

来源：

APPLIED SURFACE SCIENCE | 2000年 / 157卷 / 04期

关键词：

non-contact AFM; STM; fullerene; C-60; Si(111); contrast inversion;

D O I：

10.1016/S0169-4332(99)00531-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Fullerene (C-60) monolayer and multilayer thin films deposited on the Si(111)-7 X 7 surface have been investigated by non-contact atomic force microscopy (NC-AFM). Molecular-like features on the monolayer film and individual molecules on the crystalline islands of the multilayer films have been successfully resolved. We discuss the structures of C-60 thin films and the mechanisms of some observed artifacts. Furthermore, a contact potential difference (CPD) between the crystalline islands and the monolayer region was clearly observed. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：228 / 232

页数：5

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