Very high resolution measurement of the penetration depth of superconductors by a novel single-coil inductance technique

被引:38
作者
Gauzzi, A
Le Cochec, J
Lamura, G
Jönsson, BJ
Gasparov, VA
Ladan, FR
Plaçais, B
Probst, PA
Pavuna, D
Bok, J
机构
[1] Ecole Super Phys & Chim Ind Ville Paris, Lab Phys Solide, F-75231 Paris, France
[2] CNR, MASPEC, I-43010 Parma, Italy
[3] Ecole Polytech Fed Lausanne, Dept Phys, CH-1015 Lausanne, Switzerland
[4] Ecole Normale Super, Phys Mat Condensee Lab, CNRS, UMR 8551, F-75231 Paris 5, France
[5] Univ Paris 06, F-75231 Paris 5, France
[6] Univ Paris 07, F-75231 Paris 5, France
[7] Sci Consulting, CH-1603 Grandvaux, Switzerland
[8] Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Russia
关键词
D O I
10.1063/1.1150597
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We describe a novel single-coil mutual inductance technique for measuring the magnetic penetration depth lambda of superconductors at 2-4 MHz as a function of temperature in the 4-100 K range. We combine a single-coil configuration with a high-stability marginal oscillator; this enables us to measure the absolute value of lambda on both bulk samples and thin films with very high resolution (delta lambda=10 pm) and a precision of 30 nm. As example of application, we report measurements on NbTi bulk samples and Nb films. This contactless technique is suited for probing the superconducting properties of samples over large surfaces. (C) 2000 American Institute of Physics. [S0034-6748(00)02505-3].
引用
收藏
页码:2147 / 2153
页数:7
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