Microwave loss-factor of BaxSr1-xTiO3 as a function of temperature, biasing field, barium concentration, and frequency

被引：51

作者：

Vendik, OG ^{[1
]}

Zubko, SP ^{[1
]}

Nikol'ski, MA ^{[1
]}

机构：

[1] Electrotech Univ, Dept Elect, St Petersburg 197376, Russia

来源：

JOURNAL OF APPLIED PHYSICS | 2002年 / 92卷 / 12期

关键词：

D O I：

10.1063/1.1524314

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A correct and verifiable model of the dielectric loss factor of BaxSr1-xTiO3 as a function of temperature, biasing field, barium concentration, and frequency has been developed in frequency range 0.1-100 GHz. Contributions to the loss factor of fundamental, quasi-Debye, acoustic, and low frequency relaxation mechanisms have been modeled. The specified frequency dependence of the loss factor has been taken into account. The fitting parameters of the model provide a good agreement between experimental and simulated data. (C) 2002 American Institute of Physics.

引用

页码：7448 / 7452

页数：5

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