Metallization induced band bending of SrTiO3(100) and Ba0.7Sr0.3TiO3

被引：100

作者：

Copel, M

Duncombe, PR

Neumayer, DA

Shaw, TM

Tromp, RM

机构：

[1] IBM Research Division, T. J. Watson Research Center, Yorktown Heights

来源：

APPLIED PHYSICS LETTERS | 1997年 / 70卷 / 24期

关键词：

D O I：

10.1063/1.119148

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have investigated the interaction of Pt with single-crystal SrTiO3(001) and polycrystalline Ba0.7Sr0.3TiO3 thin films using photoemission spectroscopies. Significant band bending is caused by interface formation,determining the Schottky barrier height. We have depth profiled the band bending for Ba0.7Sr0.3TiO3 thin films, giving a direct measurement of the depletion depth and built-in potential. (C) 1997 American Institute of Physics.

引用

页码：3227 / 3229

页数：3

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