Thermal stability of IrMn and MnFe exchange-biased magnetic tunnel junctions

被引：56

作者：

Samant, MG ^{[1
]}

Lüning, J ^{[1
]}

Stöhr, J ^{[1
]}

Parkin, SSP ^{[1
]}

机构：

[1] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 21期

关键词：

D O I：

10.1063/1.126535

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The thermal stability of exchange-biased magnetic tunnel junctions is explored using near-edge x-ray absorption fine-structure spectroscopy. Structures with Ir-Mn antiferromagnetic exchange bias layers are much more thermally stable than similar structures with Fe-Mn exchange bias layers. In both cases, diffusion of Mn from the antiferromagnetic layer through thin exchange-biased ferromagnetic layers to the tunnel barrier is observed at elevated temperatures. This observation explains the diminished magnetoresistance of these structures on annealing even though the resistance of the tunnel junctions is hardly changed. (C) 2000 American Institute of Physics. [S0003-6951(00)04621-0].

引用

页码：3097 / 3099

页数：3

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