High-resolution micromachined interferometric accelerometer

被引:66
作者
Cooper, EB [1 ]
Post, ER
Griffith, S
Levitan, J
Manalis, SR
Schmidt, MA
Quate, CF
机构
[1] MIT, Media Lab, Cambridge, MA 02139 USA
[2] MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA
[3] Stanford Univ, Ginzton Lab, Stanford, CA 94305 USA
关键词
D O I
10.1063/1.126637
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate a promising type of microfabricated accelerometer that is based on the optical interferometer. The interferometer consists of surface-micromachined interdigital fingers that are alternately attached to a proof mass and support substrate. Illuminating the fingers with coherent light generates a series of diffracted optical beams. Subangstrom displacements between the proof mass and frame are detected by measuring the intensity of a diffracted beam. The structure is fabricated with a two-mask silicon process and detected with a standard laser diode and photodetector. We estimate that the minimum detectable acceleration is six orders of magnitude below the acceleration of gravity, i.e., 2 mu g/root Hz in a 1 Hz bandwidth centered at 650 Hz. (C) 2000 American Institute of Physics. [S0003-6951(00)02122-7].
引用
收藏
页码:3316 / 3318
页数:3
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