Artefacts in AFM studies of membranes: correcting pore images using fast fourier transform filtering

被引:48
作者
Bowen, WR [1 ]
Doneva, TA [1 ]
机构
[1] Univ Wales, Dept Chem & Biol Proc Engn, Ctr Complex Fluids Proc, Swansea SA2 8PP, W Glam, Wales
基金
英国工程与自然科学研究理事会;
关键词
atomic force microscopy; fast fourier transform filtering; membrane pore shape;
D O I
10.1016/S0376-7388(00)00297-0
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Fast fourier transform (FFT) filtering has been used to remove unwanted frequencies (noise) in atomic force microscope (AFM) images of Cyclopore and Nuclepore membranes of nominal pore sizes 0.1 and 0.015 mu m, respectively. Such unwanted frequencies can result in initial production of distorted images, typically showing apparent pore elongation, especially with the use of cantilevers of low spring constant, higher scanning rates and for smell pores. The distorted images are associated with markedly asymmetric power spectra. Application of filtering to restore the symmetry of the power spectra results in images showing the true pore shape. This filtering technique is a powerful asset in AFM studies of membranes, especially those of small pore size. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:141 / 147
页数:7
相关论文
共 22 条
[1]   ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274
[2]   Investigations of surface properties of polymeric membranes by near field microscopy [J].
Bessieres, A ;
Meireles, M ;
Coratger, R ;
Beauvillain, J ;
Sanchez, V .
JOURNAL OF MEMBRANE SCIENCE, 1996, 109 (02) :271-284
[3]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[4]  
Bowen WR, 1997, J MEMBRANE SCI, V126, P77
[5]  
Bowen WR, 1996, J MEMBRANE SCI, V110, P229
[6]  
Bowen WR, 1996, J MEMBRANE SCI, V110, P233
[7]   Characterisation of nanofiltration membranes for predictive purposes - Use of salts, uncharged solutes and atomic force microscopy [J].
Bowen, WR ;
Mohammad, AW ;
Hilal, N .
JOURNAL OF MEMBRANE SCIENCE, 1997, 126 (01) :91-105
[8]   Atomic force microscope studies of membranes: Surface pore structures of diaflo ultrafiltration membranes [J].
Bowen, WR ;
Hilal, N ;
Lovitt, RW ;
Williams, PM .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1996, 180 (02) :350-359
[9]  
BOWEN WR, 1999, SURFACE CHEM ELECTRO, P1
[10]   PORE-SIZE DISTRIBUTIONS IN MICROPOROUS MEMBRANES .1. SURFACE STUDY OF TRACK-ETCHED FILTERS BY IMAGE-ANALYSIS [J].
CALVO, JI ;
HERNANDEZ, A ;
CARUANA, G ;
MARTINEZ, L .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1995, 175 (01) :138-150