Investigation of the growth process and properties of CuIn5S8 and AgIn5S8 spinel thin films

被引：46

作者：

Makhova, L ^{[1
]}

Szargan, R ^{[1
]}

Konovalov, I ^{[1
]}

机构：

[1] Univ Leipzig, Wilhelm Ostwald Inst Physik & Theoret Chem, D-04103 Leipzig, Germany

来源：

THIN SOLID FILMS | 2005年 / 472卷 / 1-2期

关键词：

spinel films; X-ray diffraction; X-ray photoelectron spectroscopy (XPS); electrical properties and measurements;

D O I：

10.1016/j.tsf.2004.06.128

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigated the preparation of CuIn5S8 and AgIn5S8 spinel thin films by sulphurization of Cu-In and Ag-In alloy films in sulphur vapour. We found that a good adhesion to the substrate (Mo-coated glass) could be achieved by the introduction of a Ti layer between the substrate and the spinel layer. A layer of a titanium sulphide was formed at the interface between Ti and the spinel layer. CuIn2 and AgIn2 phases in the Cu-In and Ag-In precursor alloy films and phases of cubic CuIn5S8 and AgIn5S8 spinels have been detected by X-ray diffraction. Most of the films show n-type conductivity. The electron concentration varies from the intrinsic to 10(18) cm(-3). (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：157 / 163

页数：7

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