Investigation of the growth process and properties of CuIn5S8 and AgIn5S8 spinel thin films

被引:46
作者
Makhova, L [1 ]
Szargan, R [1 ]
Konovalov, I [1 ]
机构
[1] Univ Leipzig, Wilhelm Ostwald Inst Physik & Theoret Chem, D-04103 Leipzig, Germany
关键词
spinel films; X-ray diffraction; X-ray photoelectron spectroscopy (XPS); electrical properties and measurements;
D O I
10.1016/j.tsf.2004.06.128
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the preparation of CuIn5S8 and AgIn5S8 spinel thin films by sulphurization of Cu-In and Ag-In alloy films in sulphur vapour. We found that a good adhesion to the substrate (Mo-coated glass) could be achieved by the introduction of a Ti layer between the substrate and the spinel layer. A layer of a titanium sulphide was formed at the interface between Ti and the spinel layer. CuIn2 and AgIn2 phases in the Cu-In and Ag-In precursor alloy films and phases of cubic CuIn5S8 and AgIn5S8 spinels have been detected by X-ray diffraction. Most of the films show n-type conductivity. The electron concentration varies from the intrinsic to 10(18) cm(-3). (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:157 / 163
页数:7
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