Chemical characterization of environmental and industrial particulate samples

被引:30
作者
Ortner, HM
Hoffmann, P
Stadermann, FJ
Weinbruch, S
Wentzel, M
机构
[1] Tech Univ Darmstadt, Dept Chem Analyt, Div Sci Mat, D-64287 Darmstadt, Germany
[2] Washington Univ, McDonnel Ctr Space Sci, St Louis, MO 63130 USA
[3] Max Planck Inst Chem, Dept Biogeochem, D-55020 Mainz, Germany
关键词
particle characterization; total reflection X-ray fluorescence spectrometry; electron probe microanalysis; transmission electron microscopy; secondary ion mass spectrometry; topochemical methods; element speciation; compound identification;
D O I
10.1039/a707457c
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The characterization of particles, especially aerosol particles, is of great importance to many scientific fields, A relevant brief overview is given, A rigorous scheme of sampling and in-depth characterization of particulate samples has been developed in the authors' laboratories and by collaborative groups, including investigations by the following techniques: total reflection X-ray fluorescence spectrometry for quantitative bulk characterization; solid-state speciation by valence band X-ray spectrometry using electron microprobe or Mossbauer spectrometry (only bulk particle characterization possible); scanning electron microscopy and electron probe microanalysis for automatic semiquantitative single particle characterization of particles greater than or equal to 0.5 mu m; transmission electron microscopy for semiquantitative single particle characterization of particles with diameters down to 10 nm; high resolution-scanning electron microscopy, which is also capable of characterizing particles morphologically and qualitatively down to 10 nm in diameter; secondary ion mass spectrometry for the study of trace elemental distributions and isotopic ratios in particles with diameters above 1 mu m, It is the aim of this paper to show the advantages and characteristics of this scheme of analysis to match today's requirements for topochemical methods of analysis. For this purpose a short overview of these methods for particle characterization is also presented.
引用
收藏
页码:833 / 842
页数:10
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