A GENERAL CHARACTERISTIC FLUORESCENCE CORRECTION FOR THE QUANTITATIVE ELECTRON MICROBEAM ANALYSIS OF THICK SPECIMENS, THIN-FILMS AND PARTICLES

被引：42

作者：

ARMSTRONG, JT

BUSECK, PR

机构：

[1] ARKANSAS STATE UNIV,DEPT CHEM,STATE UNIV,AR 72467

[2] ARKANSAS STATE UNIV,DEPT GEOL,STATE UNIV,AR 72467

来源：

X-RAY SPECTROMETRY | 1985年 / 14卷 / 04期

关键词：

D O I：

10.1002/xrs.1300140408

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：172 / 182

页数：11

共 25 条

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[3]

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[9] CHARACTERISTIC FLUORESCENCE CORRECTION FOR ELECTRON-PROBE MICROANALYSIS OF THIN COATINGS [J].

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[10]

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