'Wrong bonds' in sputtered amorphous Ge2Sb2Te5

被引：72

作者：

Jovari, P.

Kaban, I.

Steiner, J.

Beuneu, B.

Schops, A.

Webb, A.

机构：

[1] Hungarian Acad Sci, Res Inst Solid State Phys & Opt, H-1525 Budapest, Hungary

[2] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany

[3] Rhein Westfal TH Aachen, Inst Phys, D-52056 Aachen, Germany

[4] CEA Saclay, Lab Leon Brillouin, F-91191 Gif Sur Yvette, France

[5] HASYLAB Deutschen Elekt Synchroton, DESY, D-22603 Hamburg, Germany

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2007年 / 19卷 / 33期

关键词：

D O I：

10.1088/0953-8984/19/33/335212

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The structure of sputtered amorphous Ge2Sb2Te5 was investigated by high energy x-ray diffraction, neutron diffraction and Ge-, Sb- and Te K-edge EXAFS measurements. The five datasets were modelled simultaneously in the framework of the reverse Monte Carlo simulation technique. It was found that apart from Te-Sb and Te-Ge bonds existing in the crystalline phases, Ge Ge and Sb- Ge bonding is also significant in sputtered amorphous Ge2Sb2Te5. According to our results, all components obey the '8-N' rule.

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页数：9

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