'Wrong bonds' in sputtered amorphous Ge2Sb2Te5

被引:72
作者
Jovari, P.
Kaban, I.
Steiner, J.
Beuneu, B.
Schops, A.
Webb, A.
机构
[1] Hungarian Acad Sci, Res Inst Solid State Phys & Opt, H-1525 Budapest, Hungary
[2] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany
[3] Rhein Westfal TH Aachen, Inst Phys, D-52056 Aachen, Germany
[4] CEA Saclay, Lab Leon Brillouin, F-91191 Gif Sur Yvette, France
[5] HASYLAB Deutschen Elekt Synchroton, DESY, D-22603 Hamburg, Germany
关键词
D O I
10.1088/0953-8984/19/33/335212
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The structure of sputtered amorphous Ge2Sb2Te5 was investigated by high energy x-ray diffraction, neutron diffraction and Ge-, Sb- and Te K-edge EXAFS measurements. The five datasets were modelled simultaneously in the framework of the reverse Monte Carlo simulation technique. It was found that apart from Te-Sb and Te-Ge bonds existing in the crystalline phases, Ge Ge and Sb- Ge bonding is also significant in sputtered amorphous Ge2Sb2Te5. According to our results, all components obey the '8-N' rule.
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页数:9
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共 30 条
[21]   On the partial structure factors of molten zinc chloride [J].
Neuefeind, J .
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2001, 3 (18) :3987-3993
[22]   Density changes upon crystallization of Ge2Sb2.04Te4.74 films [J].
Njoroge, WK ;
Wöltgens, HW ;
Wuttig, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2002, 20 (01) :230-233
[23]   Crystal structure of GeTe and Ge2Sb2Te5 meta-stable phase [J].
Nonaka, T ;
Ohbayashi, G ;
Toriumi, Y ;
Mori, Y ;
Hashimoto, H .
THIN SOLID FILMS, 2000, 370 (1-2) :258-261
[24]   REVERSIBLE ELECTRICAL SWITCHING PHENOMENA IN DISORDERED STRUCTURES [J].
OVSHINSKY, SR .
PHYSICAL REVIEW LETTERS, 1968, 21 (20) :1450-+
[25]   AMORPHOUS SILICA STUDIED BY HIGH-ENERGY X-RAY-DIFFRACTION [J].
POULSEN, HF ;
NEUEFEIND, J ;
NEUMANN, HB ;
SCHNEIDER, JR ;
ZEIDLER, MD .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1995, 188 (1-2) :63-74
[26]   Crystal nucleation and growth processes in Ge2Sb2Te5 [J].
Privitera, S ;
Bongiorno, C ;
Rimini, E ;
Zonca, R .
APPLIED PHYSICS LETTERS, 2004, 84 (22) :4448-4450
[27]   Large displacement of germanium atoms in crystalline Ge2Sb2Te5 -: art. no. 081904 [J].
Shamoto, S ;
Yamada, N ;
Matsunaga, T ;
Proffen, T ;
Richardson, JW ;
Chung, JH ;
Egami, T .
APPLIED PHYSICS LETTERS, 2005, 86 (08) :1-3
[28]   EXAFS study of Sb-Te alloy films [J].
Tani, K ;
Yiwata, N ;
Harigaya, M ;
Emura, S ;
Nakata, Y .
JOURNAL OF SYNCHROTRON RADIATION, 2001, 8 :749-751
[29]   Laser induced crystallization of amorphous Ge2Sb2Te5 films [J].
Weidenhof, V ;
Friedrich, I ;
Ziegler, S ;
Wuttig, M .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (06) :3168-3176
[30]   Reverse Monte Carlo analysis of extended x-ray absorption fine structure spectra of monoclinic and amorphous zirconia [J].
Winterer, M .
JOURNAL OF APPLIED PHYSICS, 2000, 88 (10) :5635-5644