Accurate determination of the ordinary index profile of proton-exchanged waveguides

被引：6

作者：

Marangoni, M ^{[1
]}

Ramponi, R

Osellame, R

Russo, V

机构：

[1] CNR, Ist Nazl Fis Mat, Dipartimento Fis, Politecn Milan, I-20133 Milan, Italy

[2] CNR, Ctr Elettron Quant & Strumentaz Elettron, I-20133 Milan, Italy

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2000年 / 18卷 / 09期

关键词：

integrated optics; optical device fabrication; optical planar waveguides; optical planar waveguide couplers; optical propagation in anisotropic media; optical propagation in nonlinear media; optical variables measurement; optical waveguide theory;

D O I：

10.1109/50.871702

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new method for an accurate characterization of the ordinary refractive index profile of proton-exchanged waveguides is presented and discussed, The method is based on the measurement of the power coupled into radiation modes of the waveguide as a function of the corresponding effective indexes, and allows the determination of the depth and of the film refractive index of the ordinary profile by a least squares fitting of the experimental points. The:depth and the film refractive index have been experimentally obtained with an accuracy of 0.005 mu m and 0.0001, respectively.

引用

页码：1250 / 1255

页数：6

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