Temperature determination using molecular spectra simulation

被引：9

作者：

Pellerin, S

Koulidiati, J

Motret, O

Musiol, K

De Graaf, M

Pokrzywka, B

Chapelle, J

机构：

[1] Univ Orleans, GREMI, F-45067 Orleans 2, France

[2] Univ Ouagadougou, FAST, Dept Phys, Ouagadougou 03, Burkina Faso

[3] Jagiellonian Univ, Inst Phys, PL-30459 Krakow, Poland

[4] Aerotherm Lab, F-45071 Orleans 2, France

[5] Crakow Pedag Univ, Inst Phys, PL-30084 Krakow, Poland

来源：

HIGH TEMPERATURE MATERIAL PROCESSES | 1997年 / 1卷 / 04期

关键词：

emission spectroscopy; OH; C-2 and CH bands; spectrum simulation; boltzmann plot;

D O I：

10.1615/HighTempMatProc.v1.i4.80

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Noisy and spectrally not well resolved molecular emission spectra were employed for evaluation of the rotational and vibration temperature in different plasma sources. This diagnostic method may be applied in a large temperature range. It is especially useful when the apparatus function of a recording system is unknown. The described method is based on a comparison of experimental data with a theoretically calculated spectrum. A numerical minimization procedure is started with the temperature value obtained from the Boltzmann plot or intensity ratio of two selected spectrum components. Examples are given with C-2(d(3) Pi(g),v'=0)-->C-2(a(3) Pi(u),v(")=0) swan band at 516.611 nm, OH(A(2) Sigma(+),v'=0)-->OH(X-2 Pi,v'=0) band at 306.357 nm, and CH(A(2) Delta-X-2 Pi) system around 431.5 nm.

引用

页码：493 / 509

页数：17