Origin of the large band-gap bowing in highly mismatched semiconductor alloys

被引:61
作者
Wu, J [1 ]
Walukiewicz, W
Yu, KM
Ager, JW
Haller, EE
Miotkowski, I
Ramdas, AK
Su, CH
Sou, IK
Perera, RCC
Denlinger, JD
机构
[1] Univ Calif Berkeley, Appl Sci & Technol Grad Grp, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[3] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[4] Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
[5] NASA, George C Marshall Space Flight Ctr, Sci Directorate SD46, Huntsville, AL 35812 USA
[6] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China
[7] Lawrence Berkeley Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
[8] Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
关键词
D O I
10.1103/PhysRevB.67.035207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Photomodulated reflection, optical absorption, and photoluminescence spectroscopies have been used to measure the composition dependence of interband optical transitions in ZnSe1-xTex and ZnS1-xTex alloys. The results reveal entirely different origins of the large band-gap bowing for small and large Te content. On the Te-rich side, the reduction of the band gap is well explained by the band anticrossing interaction between the Se or S localized states and the ZnTe conduction-band states. On the Se- or S-rich side, an interaction between the localized Te states and the degenerate Gamma valence bands of ZnSe or ZnS is responsible for the band-gap reduction and the rapid increase of the spin-orbit splitting with increasing Te concentration. Results of the soft-x-ray emission experiment provide direct proof of the valence-band anticrossing interaction. The band-gap bowing in the entire composition range is accounted for by a linear interpolation between the conduction-band anticrossing and valence-band anticrossing models.
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页数:5
相关论文
共 21 条
[21]   Nitrogen-induced increase of the maximum electron concentration in group III-N-V alloys [J].
Yu, KM ;
Walukiewicz, W ;
Shan, W ;
Ager, JW ;
Wu, J ;
Haller, EE ;
Geisz, JF ;
Friedman, DJ ;
Olson, JM .
PHYSICAL REVIEW B, 2000, 61 (20) :13337-13340