Defect structure studies of bulk and nano-indium-tin oxide

被引:167
作者
González, GB [1 ]
Mason, TO
Quintana, JP
Warschkow, O
Ellis, DE
Hwang, JH
Hodges, JP
Jorgensen, JD
机构
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[2] Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA
[3] Hongik Univ, Dept Mat Sci & Engn, Seoul, South Korea
[4] Oak Ridge Natl Lab, Div Met & Ceram, Spallat Neutron Source Div, Oak Ridge, TN 37831 USA
[5] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
关键词
D O I
10.1063/1.1783610
中图分类号
O59 [应用物理学];
学科分类号
摘要
The defect structure of bulk and nano-indium-tin oxide was investigated by a combination of experimental techniques, including high-resolution synchrotron x-ray diffraction, extended x-ray absorption fine structure, and time-of-flight neutron diffraction on powder specimens. The structural results include atomic positions, cation distributions, and oxygen interstitial populations for oxidized and reduced materials. These structural parameters were correlated with theoretical calculations and in situ electrical conductivity and thermopower measurements as well as existing defect models, with special reference to the model of Frank and Kostlin [G. Frank and H. Kostlin, Appl. Phys. A 27, 197 (1982)]. (C) 2004 American Institute of Physics.
引用
收藏
页码:3912 / 3920
页数:9
相关论文
共 33 条
[11]   TRANSPARENT HEAT-REFLECTING COATINGS BASED ON HIGHLY DOPED SEMICONDUCTORS [J].
FRANK, G ;
KAUER, E ;
KOSTLIN, H .
THIN SOLID FILMS, 1981, 77 (1-3) :107-117
[12]  
GONZALEZ G, IN PRESS
[13]   Neutron diffraction study on the defect structure of indium-tin-oxide [J].
González, GB ;
Cohen, JB ;
Hwang, JH ;
Mason, TO ;
Hodges, JP ;
Jorgensen, JD .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (05) :2550-2555
[14]  
GONZALEZ GB, 2003, THESIS NORTHWESTERN
[15]   OPTICAL AND ELECTRICAL PROPERTIES OF DOPED IN2O3 FILMS [J].
KOSTLIN, H ;
JOST, R ;
LEMS, W .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 29 (01) :87-93
[16]   REFINEMENT OF CRYSTAL STRUCTURE OF IN2O3 AT 2 WAVELENGTHS [J].
MAREZIO, M .
ACTA CRYSTALLOGRAPHICA, 1966, 20 :723-&
[17]   Structural studies of tin-doped indium oxide (ITO) and In4Sn3O12 [J].
Nadaud, N ;
Lequeux, N ;
Nanot, M ;
Jove, J ;
Roisnel, T .
JOURNAL OF SOLID STATE CHEMISTRY, 1998, 135 (01) :140-148
[18]   Solid solubility of SnO2 in In2O3 [J].
Ohya, Y ;
Ito, T ;
Kaneko, M ;
Ban, T ;
Takahashi, Y .
JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2000, 108 (09) :803-806
[19]   STRUCTURAL STUDY OF TIN-DOPED INDIUM OXIDE THIN-FILMS USING X-RAY ABSORPTION-SPECTROSCOPY AND X-RAY-DIFFRACTION .2. TIN ENVIRONMENT [J].
PARENT, P ;
DEXPERT, H ;
TOURILLON, G ;
GRIMAL, JM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (01) :282-285
[20]   STRUCTURAL STUDY OF TIN-DOPED INDIUM OXIDE THIN-FILMS USING X-RAY ABSORPTION-SPECTROSCOPY AND X-RAY-DIFFRACTION .1. DESCRIPTION OF THE INDIUM SITE [J].
PARENT, P ;
DEXPERT, H ;
TOURILLON, G ;
GRIMAL, JM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (01) :276-281