Power loss associated with conducting and superconducting rough interfaces

被引：63

作者：

Holloway, CL

Kuester, EF

机构：

[1] US Dept Commerce, Boulder Labs, Inst Telecommun Sci, Boulder, CO 80303 USA

[2] Univ Colorado, Dept Elect & Comp Engn, Boulder, CO 80309 USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2000年 / 48卷 / 10期

关键词：

impedance boundary condition; power loss; rough surfaces; superconducting rough interface;

D O I：

10.1109/22.873886

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In recent work, a generalized impedance boundary condition for two-dimensional conducting rough interfaces was derived. In this study, the impedance boundary condition is used to calculate the power loss associated with conducting rough interfaces. Results for two-dimensional conducting and superconducting roughness profiles are shown in this paper, and comparisons to other results in the literature are given. The importance of these roughness effects in microwave and millimeter-wave integrated circuits is also discussed. Suggestions are made to extend this study to three-dimensional random rough interfaces.

引用

页码：1601 / 1610

页数：10

共 35 条

[11] A quasi-closed form expression for the conductor loss of CPW lines, with an investigation of edge shape effects [J].