Single-electron transistor made of two crossing multiwalled carbon nanotubes and its noise properties

被引:41
作者
Ahlskog, M [1 ]
Tarkiainen, R [1 ]
Roschier, L [1 ]
Hakonen, P [1 ]
机构
[1] Helsinki Univ Technol, Low Temp Lab, FIN-02015 HUT, Finland
关键词
D O I
10.1063/1.1332107
中图分类号
O59 [应用物理学];
学科分类号
摘要
A three-terminal nanotube device was fabricated from two multiwalled nanotubes by pushing one on top of the other using an atomic-force microscope. The lower nanotube, with gold contacts at both ends, acted as the central island of a single-electron transistor while the upper one functioned as a gate electrode. Coulomb blockade oscillations were observed on the nanotube at sub-Kelvin temperatures. The voltage noise of the nanotube single-electron transistor (SET) was gain dependent as in conventional SETs. The charge sensitivity at 10 Hz was 6x10(-4) e/root Hz. (C) 2000 American Institute of Physics. [S0003-6951(00)05150-0].
引用
收藏
页码:4037 / 4039
页数:3
相关论文
共 13 条
  • [1] AHLSKOG M, UNPUB
  • [2] Single-electron transport in ropes of carbon nanotubes
    Bockrath, M
    Cobden, DH
    McEuen, PL
    Chopra, NG
    Zettl, A
    Thess, A
    Smalley, RE
    [J]. SCIENCE, 1997, 275 (5308) : 1922 - 1925
  • [3] 1/f noise in carbon nanotubes
    Collins, PG
    Fuhrer, MS
    Zettl, A
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (07) : 894 - 896
  • [4] Crossed nanotube junctions
    Fuhrer, MS
    Nygård, J
    Shih, L
    Forero, M
    Yoon, YG
    Mazzoni, MSC
    Choi, HJ
    Ihm, J
    Louie, SG
    Zettl, A
    McEuen, PL
    [J]. SCIENCE, 2000, 288 (5465) : 494 - 497
  • [5] Deformation of carbon nanotubes by surface van der Waals forces
    Hertel, T
    Walkup, RE
    Avouris, P
    [J]. PHYSICAL REVIEW B, 1998, 58 (20): : 13870 - 13873
  • [6] Noise in Al single electron transistors of stacked design
    Krupenin, VA
    Presnov, DE
    Savvateev, MN
    Scherer, H
    Zorin, AB
    Niemeyer, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1998, 84 (06) : 3212 - 3215
  • [7] Single- and multi-wall carbon nanotube field-effect transistors
    Martel, R
    Schmidt, T
    Shea, HR
    Hertel, T
    Avouris, P
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (17) : 2447 - 2449
  • [8] Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy
    Martin, M
    Roschier, L
    Hakonen, P
    Parts, U
    Paalanen, M
    Schleicher, B
    Kauppinen, EI
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (11) : 1505 - 1507
  • [9] Single-electron transistor made of multiwalled carbon nanotube using scanning probe manipulation
    Roschier, L
    Penttilä, J
    Martin, M
    Hakonen, P
    Paalanen, M
    Tapper, U
    Kauppinen, EI
    Journet, C
    Bernier, P
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (05) : 728 - 730
  • [10] Gain dependence of the noise in the single electron transistor
    Starmark, B
    Henning, T
    Claeson, T
    Delsing, P
    Korotkov, AN
    [J]. JOURNAL OF APPLIED PHYSICS, 1999, 86 (04) : 2132 - 2136