Carbon-induced undersaturation of silicon self-interstitials

被引:70
作者
Scholz, R
Gosele, U
Huh, JY
Tan, TY
机构
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle, Germany
[2] Korea Univ, Seoul 136701, South Korea
[3] Duke Univ, Sch Engn, Durham, NC 27708 USA
关键词
D O I
10.1063/1.120684
中图分类号
O59 [应用物理学];
学科分类号
摘要
Carbon diffusion into silicon is well behaved and does not generate any nonequilibrium point defects. We show that, in contrast, the diffusion of carbon incorporated in silicon well above its solid solubility will cause an undersaturation of silicon self-interstitials, which in turn may cause retarded diffusion of boron. In addition, we predict that due to this undersaturation, the diffusion of built-in carbon spikes will lead to strongly non-Gaussian concentration profiles. (C) 1998 American Institute of Physics.
引用
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页码:200 / 202
页数:3
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