Optical transmittance study of the thermal decomposition of sputtered Pt-Ag-O films

被引:16
作者
Shima, T [1 ]
Tominaga, J [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Lab Adv Opt Technol, Tsukuba, Ibaraki 3058562, Japan
关键词
transmittance; thermal decomposition; X-ray fluorescence;
D O I
10.1016/S0040-6090(02)01305-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Platinum was doped into Ag-O to prepare Pt-Ag-O (Pt composition: 1-5 at.%) film, and its thermal decomposition process was studied by measuring the change in transmitted light intensity while heating the film to 600 degreesC. X-ray fluorescence spectroscopy was used to evaluate the oxygen loss up to 260 degrees. When 1 at.% Pt was doped, the AgO to Ag2O decomposition process at 130-160 degreesC became less evident. When Pt composition was further increased, oxygen loss was somewhat suppressed, at least up to 260 degreesC, and a slight degree of Pt-O thermal decomposition became noticeable at approximately 550 degreesC. Platinum doping effectively modified the Ag-O thermal decomposition process, and giving it potential for use as a temperature control for plasmon-related techniques activated by the generation of Ag particles. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:31 / 34
页数:4
相关论文
共 16 条
[1]   Sputtered silver oxide layers for surface-enhanced Raman spectroscopy [J].
Büchel, D ;
Mihalcea, C ;
Fukaya, T ;
Atoda, N ;
Tominaga, J ;
Kikukawa, T ;
Fuji, H .
APPLIED PHYSICS LETTERS, 2001, 79 (05) :620-622
[2]  
Buchel D., 2001, Journal of the Magnetics Society of Japan, V25, P240, DOI 10.3379/jmsjmag.25.240
[3]   DECOMPOSITION KINETICS OF AGO CATHODE MATERIAL BY THERMOGRAVIMETRY [J].
DALLEK, S ;
WEST, WA ;
LARRICK, BF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (12) :2451-2454
[4]   Surface characterization study of the thermal decomposition of Ag2CO3 [J].
Epling, WS ;
Hoflund, GB ;
Salaita, GN .
JOURNAL OF PHYSICAL CHEMISTRY B, 1998, 102 (12) :2263-2268
[5]   A near-field recording and readout technology using a metallic probe in an optical disk [J].
Fuji, H ;
Tominaga, J ;
Men, L ;
Nakano, T ;
Katayama, H ;
Atoda, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (2B) :980-981
[6]   Surface characterization study of Ag, AgO, and Ag2O using x-ray photoelectron spectroscopy and electron energy-loss spectroscopy [J].
Hoflund, GB ;
Hazos, ZF ;
Salaita, GN .
PHYSICAL REVIEW B, 2000, 62 (16) :11126-11133
[7]   Characterization of sputtered amorphous platinum dioxide films [J].
Maya, L ;
Riester, L ;
Thundat, T ;
Yust, CS .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (11) :6382-6386
[8]   GROWTH AND CHARACTERIZATION OF REACTIVELY SPUTTERED THIN-FILM PLATINUM OXIDES [J].
MCBRIDE, JR ;
GRAHAM, GW ;
PETERS, CR ;
WEBER, WH .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (03) :1596-1604
[9]   Thermal stability and oxygen-loss characteristics of Pt(O) films prepared by reactive sputtering [J].
Saenger, KL ;
Cabral, C ;
Lavoie, C ;
Rossnagel, SM .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (11) :6084-6087
[10]  
SAMSONOV GV, 1982, OXIDE HDB