Comparing hyperthermal molecular and atomic ion sputtering of adsorbates:: Xe+ versus SF5+ on NH3/CO/Ni(111)

被引:21
作者
Ada, ET [1 ]
Hanley, L [1 ]
机构
[1] Univ Illinois, Dept Chem, Chicago, IL 60607 USA
关键词
molecular and ion sputtering; adsorbates; Xe+; SF5+; SIMS; secondary ion mass spectrometry;
D O I
10.1016/S0168-1176(97)00304-2
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Polyatomic ion-induced desorption of adsorbates is an important effect in secondary ion mass spectrometry, surface-induced dissociation and both ion beam and plasma processing of materials. We compared the adsorbate desorption cross-sections for a model ion-adsorbate system, NH3/CO/Ni(111) exposed to the isobaric atomic and polyatomic ions, Xe+ and SF5+, with kinetic energies of 10-1000 eV. The depletion of the adsorbate layer and the formation of new surface chemical species were monitored by X-ray photoelectron spectroscopy. Two to three times higher desorption cross-sections for both NH3 and CO were observed for SF5+ ion bombardment compared with Xe+ at the same incident energy. TRIDYN Monte Carlo simulations generally gave good agreement with the experimental results. TRIDYN implicated the larger reflected ion contributions for S and F compared with Xe as the source of the enhanced desorption yields by the polyatomic ion. Substrate damage was also found to be lower for SF5+ than Xe+ due to the former's lower energy per atom and lighter constituent atom masses. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:231 / 244
页数:14
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