Experimental study of the influence of edge roughness on magnetization switching in Permalloy nanostructures

被引：59

作者：

Bryan, MT ^{[1
]}

Atkinson, D ^{[1
]}

Cowburn, RP ^{[1
]}

机构：

[1] Univ Durham, Dept Phys, Durham DH1 3LE, England

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 16期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1063/1.1806566

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Rectangular Permalloy nanostructures with different edge roughness, but the same average width, were fabricated by controlled variations in the exposure conditions of an electron-beam lithography process. The average widths that were studied ranged from 200 to 640 nm. Structures were characterized individually using magneto-optical Kerr effect single-structure nanomagnetometry and scanning electron microscopy on the same structure. Increased edge roughness caused increased coercivity, except for 200-nm-wide structures. Large edge roughness doubled the coercivity of wide (>600 nm) structures. The coercivity of nominally identical structures (same roughness amplitude) differed by up to 20 Oe, suggesting that the specific edge profile influences magnetic switching. (C) 2004 American Institute of Physics.

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页码：3510 / 3512

页数：3

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