Apparent contrast reversal in tapping mode atomic force microscope images on films of polystyrene-b-polyisoprene-b-polystyrene

被引：33

作者：

Pickering, JP ^{[1
]}

Vancso, GJ ^{[1
]}

机构：

[1] Univ Twente, Fac Chem Technol, NL-7500 AE Enschede, Netherlands

来源：

POLYMER BULLETIN | 1998年 / 40卷 / 4-5期

关键词：

Atomic Force Microscope; Block Copolymer; Atomic Force Microscope Image; Amplitude Ratio; Contrast Variation;

D O I：

10.1007/s002890050289

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Thin films of phase separated polystyrene-b-polyisoprene-b-polystyrene block copolymers were studied by tapping mode atomic force microscopy. The relative contrast in height and phase mode images of the phase separated regions was found to be very sensitive to changes in the operating conditions of the microscope. Contrast variations and reversals were observed for height and phase mode images as a function of the setpoint amplitude ratio and drive frequency. No unique height or phase contrast was observed for the the tri-block copolymer system examined in this study.

引用

页码：549 / 554

页数：6

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