Parallel structural screening of solid materials

被引：26

作者：

Grunwaldt, Jan-Dierk ^{[1
]}

Kimmerle, Bertram

Hannemann, Stefan

Baiker, Alfons

Boye, Pit

Schroer, Christian G.

机构：

[1] ETH, Dept Chem & Appl Biosci, Honggerberg HCI, CH-8093 Zurich, Switzerland

[2] Tech Univ Dresden, Inst Struct Phys, D-01062 Dresden, Germany

来源：

JOURNAL OF MATERIALS CHEMISTRY | 2007年 / 17卷 / 25期

关键词：

D O I：

10.1039/b705334g

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-Ray absorption spectroscopy using a microreactor array in combination with an X-ray camera is applied for fast parallel structural screening of a variety of differently prepared supported palladium and copper particles in the as-prepared state and after heat pre-treatments in different gas atmospheres.

引用

页码：2603 / 2606

页数：4

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